Multi-channel measurement based on DSP development

Abstract

A real-time and simultaneous processing system with 8 analog inputs is designed. The system is based on the development of Texas Instrument TMS320VC5510 DSK kit. The analog input signals are converted into digital ones by 8 bit ADC module using ADC0809. The ADC module interfaces to the DSP in parallel, through the DSP’s Memory Expansion Connector. The measurement with standard input signals fom FUNCTION GENERATOR LG1311 is also reported