TUNNELING MAGNETORESISTANCE OF GLASS/Co/Al2O3/Fe50Co50/Ni80Fe20 NANOSTRUCTURES WITH ONE MAGNETOSTRICTIVE LAYER

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TUNNELING MAGNETORESISTANCE OF GLASS/Co/Al2O3/Fe50Co50/Ni80Fe20 NANOSTRUCTURES WITH ONE MAGNETOSTRICTIVE LAYER

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Title: TUNNELING MAGNETORESISTANCE OF GLASS/Co/Al2O3/Fe50Co50/Ni80Fe20 NANOSTRUCTURES WITH ONE MAGNETOSTRICTIVE LAYER
Author: Nguyen, Huu Duc; et. al.
Abstract: The magnetic tunnel junctions of the glass/Co(10 nm/Al2O3(tx/Co50Fe50(1.8nm/Ni80Fe20(10nm) configuration with tx varied from 1.4 to 2.6 nm were fabricated by RF-sputtering. Samples were studied by means of the AFM, HR-TEM and TMR measurements.The tunneling magnetoresistance was investigated as a function of the thickness as well as oxygen concentration of the insulating layer. Optimum configuration is obtained for tx = 1.8 nm. In this case,the magnetoresistance of 12% is reached in the applied field of about 2 mT. It turns out from the analyses of the I-V characteristic that the effective barrier width and height of the isolator equal to 1.5 nm and 1.3 eV, respectively. These magnetic tunnel junctions can be used to design pressure sensors
URI: http://hdl.handle.net/123456789/24
Date: 2008

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