Carbon vacancy-related defect in 4H and 6H SiC

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Carbon vacancy-related defect in 4H and 6H SiC

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dc.contributor.author N.T., Son
dc.contributor.author P.N., Hai
dc.contributor.author Janzen, E.
dc.date.accessioned 2011-05-09T03:47:26Z
dc.date.available 2011-05-09T03:47:26Z
dc.date.issued 2001
dc.identifier.citation Volume 63, Issue 20 Art. No.: 201201, Page 2012011-2012014 vi
dc.identifier.issn 1631829
dc.identifier.uri http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7183
dc.description.abstract An electron paramagnetic resonance (EPR) spectrum was observed at temperatures above 25 K in p-type 4H and 6H SiC irradiated with electrons. The center has C3v symmetry with an electron spin S = 1/2. Using high frequency (?95 GHz) EPR it was possible to obtain the detailed hyperfine structure due to the interaction with the four nearest silicon neighbors, and to identify the defect as the carbon vacancy in the positive-charge state (Vc+). The g values and hyperfine tensor of the center in both polytypes are almost the same and no dependence on the inequivalent lattice sites has been detected. vi
dc.language.iso en vi
dc.publisher Physical Review B - Condensed Matter and Materials Physics vi
dc.subject carbon vi
dc.subject silicon vi
dc.subject article vi
dc.subject electron vi
dc.subject electron spin resonance vi
dc.subject high temperature procedures vi
dc.title Carbon vacancy-related defect in 4H and 6H SiC vi
dc.type Article vi

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