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Tai Nguyen So - Vietnam National University, Ha Noi - VNU
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Browsing by Author Ammerlaan C.A.J.
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Showing results 1 to 4 of 4
Issue Date
Title
Author(s)
1997
Copper-related defects in silicon: Electron-paramagnetic-resonance identification
Hai P.N.
;
Gregorkiewicz T.
;
Ammerlaan C.A.J.
;
Don D.T.
1997
Electron-paramagnetic-resonance study of silver-induced defects in silicon
Hai P.N.
;
Gregorkiewicz T.
;
Ammerlaan C.A.J.
;
Don D.T.
1997
Isolated substitutional silver and silver-induced defects in silicon: An electron paramagnetic resonance investigation
Hai P.N.
;
Gregorkiewicz T.
;
Ammerlaan C.A.J.
;
Don D.T.
2006
Structural and optical properties of Si-nanoclusters embedded in silicon dioxide
Huy P.T.
;
Thu V.V.
;
Chien N.D.
;
Ammerlaan C.A.J.
;
Weber J.
Showing results 1 to 4 of 4
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