The stability diagrams and simulation of finite temperature current-voltage characteristics for metallic double-dot devices, were analyzed. The systematic analysis of stability diagrams was described which depends on each of coupling capacitances for the metallic double-dot device. It was observed that the cross-couplings essentially effect both size and shape of diagram cells. The results shows that negative differential conductance (NDC) is suppressed by increasing temperature and/or introducing offset charge and is very sensitive to device parameters.
