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Please use this identifier to cite or link to this item: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/11850

Title: High aspect ratio through-wafer interconnections for 3D-microsystems
Authors: Wang L.
Nichelatti A.
Schellevis H.
De Boer C.
Visser C.
Nguyen T.N.
Sarro P.M.
Keywords: 
Issue Date: 2003
Publisher: Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS)
Citation: Volume , Issue , Page 634-637
Abstract: Closely spaced, through-wafer interconnects are of large interest in RF MEMS and MEMS packaging. In this paper, a suitable technique to realize large arrays of small size through-wafer holes is presented. This approach is based on macroporous silicon formation in combination with wafer thinning. Very high aspect ratio (≥ 100) structures are realized. The wafers containing the large arrays of 2-3μm wide holes are thinned down to 200-150μm by lapping and polishing. Copper electroplating is finally employed to realize arrays of high aspect ratio Cu plugs.
URI: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/11850
ISSN: 
Appears in Collections:Articles of Universities of Vietnam from Scopus

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