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Tai Nguyen So - Vietnam National University, Ha Noi - VNU >
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http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/12624
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| Title: | Correlation-length-based sampling conditions for various engineering surfaces |
| Authors: | Nguyen A.T.
Butler D.L. |
| Keywords: | Correlation length
Sampling condition
Surface measurement |
| Issue Date: | 2005 |
| Publisher: | Measurement Science and Technology |
| Citation: | Volume 16, Issue 9, Page 1813-1822 |
| Abstract: | The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis. © 2005 IOP Publishing Ltd. |
| URI: | http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/12624 |
| ISSN: | 9570233 |
| Appears in Collections: | Articles of Universities of Vietnam from Scopus
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