The Texas Instrument TMS320VC5510 DSK’s calculation abilitiy with different
program languages is investigated for minimum the DSP’s measurement time. The steps of Monte
Carlo simulations embedded into the DSK’s flash through the DSK’s JTAG interface for optical
parameters measurement including absorption coefficient
a m , scattering coefficient
s
m and
anisotropy g are presented. The obtained results for diluted milk standard samples are also
reported.
