Copper Degradation Iron Magnetoresistance Oxides Problem solving Transmission electron microscopy X ray analysis Oxide layers (OXL) Ratio degradation Spin valves Microstructure
Issue Date:
2005
Publisher:
Journal of Physics D: Applied Physics
Citation:
Volume 38, Issue 19, Page 3560-3566
Abstract:
Neither the reaction mechanism of chemical elements (Mn, Fe, Co) in specular spin valves (SVs)
nor the microstructures of specular SVs containing oxide layers (OXLs) at high temperatures (>250 ?C)
have been identified so far. We attempted to solve these problems via secondary-ion-mass spectroscopy, xray
photoelectron spectroscopy depth profile analysis, x-ray diffraction analysis and x-ray transmission
electron microscopy. The chemical properties of the constituent elements in SVs and a change in the
microstructure are found to be the main reasons for magneto resistance (MR) ratio degradation at high
temperatures. We also found that it is not only Mn atoms but also the OXL/ferromagnetic interface, which is
an intermixed region with Cu atoms, that causes MR ratio degradation at temperatures above 275 ?C. ??
2005 IOP Publishing Ltd.