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Please use this identifier to cite or link to this item: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/6736

Title: Effects of microwave fields on recombination processes in 4H and 6H SiC
Authors: Son, N.T.
Sorman, E.
Chen, W.M.
[et al.]
Issue Date: 1997
Publisher: Journal of Applied Physics
Citation: Volume: 81 Issue: 4 Page : 1929-1932
Abstract: The effects of microwave fields on recombination processes, which are responsible for the optical detection of cyclotron resonance (ODCR) in 4H and 6H SiC epitaxial layers, have been investigated. We present experimental evidence indicating that the dominant mechanism of ODCR in SiC, at low temperatures and in a common range of microwave power
URI: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/6736
ISSN: 218979
Appears in Collections:To-2000 VNU-DOI-Publications

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