Tin - dioxide (SnO2) nanostructures were prepared on silicon substrates by using thermal
evaporation of a SnO2 powder. The structure and the morphology of the as-synthesized products were
characterized by X-ray diffraction, scanning electron microscopy (SEM), high-resolution transmission
electron microscopy (HRTEM), selective area electron diffraction (SAED) and Raman scattering. The X-ray
spectroscopy analysis indicated that the nanowires had the same crystal structure as that found in the rutile
form of SnO2. The film was a large array of SnO2 nanowires with average diameters from 50 nm to 110 nm
and typical length in the range of several tens of micrometers.
