Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra

Abstract

The absorption coefficient, refractive index and thickness of amorphous vanadium pentoxide thin films have been determined from reflectance interference spectra in the wavelength range of 450-710 nm. In the photon energy range of 2.15-2.70 eV the wavelength dependence of the absorption coefficient obeys Urbach's rule. ?? 1983 with the authors.