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Please use this identifier to cite or link to this item: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7183

Title: Carbon vacancy-related defect in 4H and 6H SiC
Authors: N.T., Son
P.N., Hai
Janzen, E.
Keywords: carbon
silicon
article
electron
electron spin resonance
high temperature procedures
Issue Date: 2001
Publisher: Physical Review B - Condensed Matter and Materials Physics
Citation: Volume 63, Issue 20 Art. No.: 201201, Page 2012011-2012014
Abstract: An electron paramagnetic resonance (EPR) spectrum was observed at temperatures above 25 K in p-type 4H and 6H SiC irradiated with electrons. The center has C3v symmetry with an electron spin S = 1/2. Using high frequency (?95 GHz) EPR it was possible to obtain the detailed hyperfine structure due to the interaction with the four nearest silicon neighbors, and to identify the defect as the carbon vacancy in the positive-charge state (Vc+). The g values and hyperfine tensor of the center in both polytypes are almost the same and no dependence on the inequivalent lattice sites has been detected.
URI: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7183
ISSN: 1631829
Appears in Collections:2001-2005 VNU-DOI-Publications

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