Chemical synthesis Semiconductors Luminescence Deposition
Issue Date:
2006
Publisher:
Applied Surface Science
Citation:
Volume: 252, Issue: 8, Page : 2770-2775
Abstract:
ZnO:In films are successfully prepared by using the electrostatic spray deposition technique. X-ray
diffraction indicates that the ZnO:In films have a polycrystalline hexagonal wurtzite structure with lattice
parameters a=3.267 ?? and c=5.209 ??. Photoluminescence properties of the films are investigated in the
temperature range of 11.6-300 K, showing strong luminescence in the whole range of temperature. The
temperature dependence of the photoluminescence are carried out with full profile fitting of spectra, which
clearly shows that the ultraviolet (UV) emission in In-doped ZnO films at low temperature are attributed to
emission of a neutral donor-bound exciton (D?X) and recombination of donor-acceptor pairs (DAP), while
the UV emission at room temperature originates from radiative transition of an electron bound on a donor to
the valence band. ?? 2005 Elsevier B.V. All rights reserved.