Colossal magnetoresistance Electric resistance Electronic structure Magnetic field Magnetoelectronics Manganese Electric resistance Manganites Electronic structure Oxide minerals
Issue Date:
2009
Publisher:
Journal of Physics D: Applied Physics
Citation:
Volume: 42, Volume: 42, Art. No.: 65005, Link: Scorpus Link
Abstract:
The transport and magnetotransport properties of a newly fabricated tunnel structure
manganite/depletion layer/manganese silicide have been studied in the current-in-plane (CIP) geometry. A
manganite depletion layer in the structure forms a potential barrier sandwiched between two conducting
layers, one of manganite and the other of manganese silicide. The voltage-current characteristics of the
structure are nonlinear due to switching conducting channels from an upper manganite film to a bottom,
more conductive MnSi layer with an increase in the current applied to the structure. Bias current assists
tunnelling of a carrier across the depletion layer; thus, a low-resistance contact between the current-carrying
electrodes and the bottom layer is established. Below 30 K, both conducting layers are in the ferromagnetic
state (magnetic tunnel junction), which allows control of the resistance of the tunnel junction and,
consequently, switching of the conducting channels by the magnetic field. This provides a fundamentally
new mechanism of magnetoresistance (MR) implementation in the magnetic layered structure with CIP
geometry. MR of the structure under study depends on the bias current and can reach values greater than
400% in a magnetic field lower than 1 kOe. A positive MR value is related to peculiarities of the spinpolarized
electronic structures of manganites and manganese silicides. ?? 2009 IOP Publishing Ltd.