| dc.contributor.author |
Phan, L. |
|
| dc.contributor.author |
Michailovits, L. |
|
| dc.contributor.author |
Hevesi, I. |
|
| dc.date.accessioned |
2011-05-07T04:40:25Z |
|
| dc.date.available |
2011-05-07T04:40:25Z |
|
| dc.date.issued |
1983 |
|
| dc.identifier.citation |
Volume: 54 Issue: 2-Jan Page : 119-124 |
vi |
| dc.identifier.issn |
2314428 |
|
| dc.identifier.uri |
http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7025 |
|
| dc.description.abstract |
The absorption coefficient, refractive index and thickness of amorphous vanadium pentoxide thin
films have been determined from reflectance interference spectra in the wavelength range of 450-710 nm. In
the photon energy range of 2.15-2.70 eV the wavelength dependence of the absorption coefficient obeys
Urbach's rule. ?? 1983 with the authors. |
vi |
| dc.language.iso |
en |
vi |
| dc.publisher |
Acta Physica Hungarica |
vi |
| dc.subject |
absorption |
vi |
| dc.title |
Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra |
vi |
| dc.type |
Article |
vi |