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Title:
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Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra |
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Author:
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Phan, L.; Michailovits, L.; Hevesi, I.
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Abstract:
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The absorption coefficient, refractive index and thickness of amorphous vanadium pentoxide thin
films have been determined from reflectance interference spectra in the wavelength range of 450-710 nm. In
the photon energy range of 2.15-2.70 eV the wavelength dependence of the absorption coefficient obeys
Urbach's rule. ?? 1983 with the authors. |
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URI:
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http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7025
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Date:
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1983 |