Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra

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Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra

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Title: Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra
Author: Phan, L.; Michailovits, L.; Hevesi, I.
Abstract: The absorption coefficient, refractive index and thickness of amorphous vanadium pentoxide thin films have been determined from reflectance interference spectra in the wavelength range of 450-710 nm. In the photon energy range of 2.15-2.70 eV the wavelength dependence of the absorption coefficient obeys Urbach's rule. ?? 1983 with the authors.
URI: http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7025
Date: 1983

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