Title:
|
Determination of the refractive index, the absorption coefficient and the thickness of amorphous V2O5 thin films from reflectance interference spectra |
Author:
|
Phan, L.; Michailovits, L.; Hevesi, I.
|
Abstract:
|
The absorption coefficient, refractive index and thickness of amorphous vanadium pentoxide thin
films have been determined from reflectance interference spectra in the wavelength range of 450-710 nm. In
the photon energy range of 2.15-2.70 eV the wavelength dependence of the absorption coefficient obeys
Urbach's rule. ?? 1983 with the authors. |
URI:
|
http://tainguyenso.vnu.edu.vn/jspui/handle/123456789/7025
|
Date:
|
1983 |